The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Aug. 29, 2022
Applicant:

Chroma Ate Inc., Taoyuan, TW;

Inventors:

Chin-Yi Ouyang, Taoyuan, TW;

Chien-Ming Chen, Taoyuan, TW;

Assignee:

CHROMA ATE INC., Taoyuan, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65G 47/90 (2006.01); G01N 3/04 (2006.01); G01R 31/28 (2006.01); H01L 21/67 (2006.01); H01L 21/673 (2006.01); H01L 21/683 (2006.01); H05K 13/04 (2006.01);
U.S. Cl.
CPC ...
B65G 47/905 (2013.01); G01N 3/04 (2013.01); G01R 31/2867 (2013.01); G01R 31/2874 (2013.01); G01R 31/2887 (2013.01); G01R 31/2893 (2013.01); H01L 21/67236 (2013.01); H01L 21/67333 (2013.01); H01L 21/6838 (2013.01); H05K 13/0408 (2013.01);
Abstract

The present invention relates to an electronic device testing apparatus and a testing method thereof. When the test is completed, a pressing head picks up a tested electronic device from a test socket and places the tested electronic device on an output carrier, the output carrier moves out of a test zone, and an input carrier follows immediately after the output carrier and successively moves into the test zone at the same speed; after the pressing head picks up an electronic device to be tested from the input carrier, the input carrier moves out of the test zone, and the pressing head places the electronic device to be tested in the test socket. Accordingly, in the present invention, the operation of the pressing head is simplified, and the overall test efficiency is improved.


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