The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2024

Filed:

Jun. 27, 2022
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Kimitake Mizobe, Nagaokakyo, JP;

Jun Toda, Shiojiri, JP;

Takahisa Fukusen, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1633 (2013.01); B25J 9/163 (2013.01); B25J 9/1653 (2013.01);
Abstract

A method of the present disclosure includes (a) setting a limit value specifying a constraint condition with respect to a specific force control characteristic value detected in force control and an objective function with respect to a specific evaluation item relating to the work, (b) searching for an optimal value of the force control parameter using the objective function, and (c) determining a setting value of the force control parameter according to a result of the searching. The objective function has a form in which a penalty increasing according to an exceedance of the force control characteristic value from an allowable value smaller than the limit value is added to an actual measurement value of the evaluation item.


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