The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Jan. 08, 2024
Bertec Corporation, Columbus, OH (US);
Necip Berme, Worthington, OH (US);
Murat Kerim Berme, Venice, CA (US);
Mohan Chandra Baro, Columbus, OH (US);
Bertec Corporation, Columbus, OH (US);
Abstract
A measurement and testing system is disclosed herein. The measurement and testing system includes one or more first devices at a first location operatively coupled to at least one first data processing device, and one or more second devices at a second location operatively coupled to at least one second data processing device. The at least one first data processing device being configured to execute stored instructions for: generating one or more motion profiles for controlling the one or more first devices at the first location; controlling the one or more first devices at the first location based upon the one or more motion profiles; recording the one or more motion profiles at the first location; and transmitting the one or more recorded motion profiles to the second location. The at least one second data processing device being configured to execute stored instructions for receiving the one or more recorded motion profiles from the at least one first data processing device at the first location; and controlling the one or more second devices at the second location based upon the one or more recorded motion profiles from the first location.