The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2024
Filed:
Mar. 27, 2020
Applicant:
Sony Group Corporation, Tokyo, JP;
Inventor:
Masashi Murakita, Tokyo, JP;
Assignee:
Sony Group Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/62 (2017.01); A61B 1/00 (2006.01); A61B 1/045 (2006.01); G06T 7/00 (2017.01); G06T 7/66 (2017.01); G06T 7/70 (2017.01); H04N 23/50 (2023.01); H04N 23/56 (2023.01); H04N 23/71 (2023.01);
U.S. Cl.
CPC ...
A61B 1/00188 (2013.01); A61B 1/000094 (2022.02); A61B 1/000095 (2022.02); A61B 1/045 (2013.01); G06T 7/0014 (2013.01); G06T 7/62 (2017.01); G06T 7/66 (2017.01); G06T 7/70 (2017.01); H04N 23/71 (2023.01); G06T 2207/10068 (2013.01); G06T 2207/30004 (2013.01); H04N 23/555 (2023.01); H04N 23/56 (2023.01);
Abstract
An endoscope system includes circuitry configured to set a plurality of evaluation areas in an endoscope image captured by an image sensor via a scope, adjacent ones of the plurality of evaluation areas being spatially separated from one another, calculate an evaluation value for each of the plurality of evaluation areas, compare an evaluation value of the plurality of evaluation areas, and adjust an image processing on the endoscope image in accordance with a result of the comparison.