The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Feb. 08, 2023
Keysight Technologies, Inc., Santa Rosa, CA (US);
Thomas Ameling, Woodland Hills, CA (US);
Razvan Ionut Stan, Agoura Hills, CA (US);
Winston Wencheng Liu, Woodland Hills, CA (US);
Dan Mihailescu, Mogosoaia, RO;
KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);
Abstract
The subject matter described herein includes methods, systems, and computer readable media for non-intrusive queue analysis. A method for non-intrusive queue analysis occurs at a test analyzer of a test system, the test analyzer for analyzing packet queue performance of a system under test (SUT). The method comprising: receiving, via at least one mirrored ingress port of the SUT, a plurality of copied ingress test packets; receiving, via at least one mirrored egress port of the SUT, a plurality of copied egress test packets; correlating, using a correlation technique, the plurality of copied ingress test packets and the plurality of copied egress test packets; and generating, using the correlated packets, at least one packet queue performance metric associated with the SUT.