The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Mar. 02, 2023
Applicant:

National Instruments Corporation, Austin, TX (US);

Inventor:

Christopher George Cifra, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 41/5054 (2022.01); H04L 41/0806 (2022.01); H04L 61/4511 (2022.01);
U.S. Cl.
CPC ...
H04L 41/0806 (2013.01); H04L 61/4511 (2022.05);
Abstract

A method of orchestrating measurements in a measurement system includes configuring a first service with a first configuration for acquiring measurement data by an orchestrator. The method also includes receiving a moniker generated by the first service in response to being configured that represents the first configuration. The moniker includes a location of the first service and an identifier of the first configuration. The method also includes transferring the moniker to a second service configured to establish communication with the first service based on the location, consume the measurement data acquired by the first service using the first configuration and transmitted in response to receiving the identifier from the second service, and generate a result in response to receiving the measurement data from the first service. The method further includes receiving the result from the second service.


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