The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Jan. 07, 2022
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventors:

Tanuman Bhaduri, Kolkata, IN;

Kingshuk Mandal, Kolkata, IN;

Assignee:

KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04L 1/1812 (2023.01); H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
H04L 1/0083 (2013.01); H04L 1/0061 (2013.01); H04L 1/1816 (2013.01); H04L 63/123 (2013.01);
Abstract

Methods, systems, and computer readable media for measuring data integrity in time sensitive networks. An example method for testing a time sensitive network (TSN) device includes calculating a data integrity value for a preemptable frame. The method includes appending the data integrity value to an end of the preemptable frame and transmitting the preemptable frame to the TSN device, causing the TSN device to fragment the preemptable frame or to reassemble the preemptable frame after fragmentation. The method includes receiving the preemptable frame after traversing the TSN device and validating the data integrity value of the preemptable frame after traversing the TSN device.


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