The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Sep. 13, 2019
Shimadzu Corporation, Kyoto, JP;
Shinichi Yamaguchi, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
An analysis device collects data by performing a predetermined analysis on each specimen and processes the data. The analysis device includes an analysis processing unit () configured to execute multivariate analysis processing based on collected data for analysis of a difference between a plurality of measurement targets or classification of the plurality of measurement targets, a feature extraction unit () configured to extract a characteristic parameter or element estimated to be mainly related to a difference or classification from a multivariate analysis result according to a predetermined criterion, an image creation unit () configured to create an image of a predetermined two-dimensional range corresponding to the parameter or element extracted by the feature extraction unit, and a display processing unit () configured to assign a same visual aspect to the characteristic parameter or element extracted on the multivariate analysis result and the image created correspondingly and display the multivariate analysis result and the image on a display unit ().