The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Mar. 17, 2023
Applicant:

Kioxia Corporation, Tokyo, JP;

Inventors:

Eyal Nitzan, Haifa, IL;

Avi Steiner, Haifa, IL;

Hanan Weingarten, Haifa, IL;

Yasuhiko Kurosawa, Yokohama, JP;

Assignee:

KIOXIA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); H03M 13/01 (2006.01); H03M 13/11 (2006.01); H03M 13/43 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3431 (2013.01); H03M 13/015 (2013.01); H03M 13/1108 (2013.01); H03M 13/43 (2013.01);
Abstract

A method for reading data from an SSD, comprising: retrieving data from a target row of memory cells using initial threshold voltages; decoding the data using a first hard decision decoding stage; estimating a bit error rate (BER) of a target row of memory cells based on a distribution of threshold voltages of cells in a memory block containing the target row when the first hard decision decoding stage fails; classifying the BER of the target row based on a first BER threshold (BER-TH1); and executing a first read flow comprising at least one hard decision decoding stage if the BER is less than the BER-TH1, and executing a second read flow similar to the first read flow if the BER is greater than or equal to the BER-TH1, the second read flow skipping a hard decision decoding stage of the first read flow.


Find Patent Forward Citations

Loading…