The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Oct. 19, 2020
Applicant:

Xi'an Novastar Tech Co., Ltd., Shaanxi, CN;

Inventors:

Yue Zhang, Shaanxi, CN;

Hongchun Cong, Shaanxi, CN;

Cheng Yang, Shaanxi, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/20 (2006.01); G09G 3/32 (2016.01);
U.S. Cl.
CPC ...
G09G 3/2007 (2013.01); G09G 3/32 (2013.01); G09G 2360/16 (2013.01);
Abstract

Provided are a method and an apparatus for gray scale measurement. The method may include: a first part of gray scale data of an LED screen is collected when the LED screen is displaying an image; a type of a chip used for driving the LED screen is determined; and a second part of gray scale data of the LED screen is predicted based on the type of the chip and the first part of gray scale data.


Find Patent Forward Citations

Zhang, Yue. (2024). Method for gray scale measurement, non-transitory storage medium, and processor (U.S. Patent No. 12175910). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12175910

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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