The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Apr. 29, 2021
Applicant:

Capital One Services, Llc, McLean, VA (US);

Inventors:

Daniel Alan Jarvis, Vienna, VA (US);

Jason Pribble, McLean, VA (US);

Nicholas Capurso, Tysons Corner, VA (US);

Assignee:

Capital One Services, LLC, McLean, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/00 (2022.01); G06T 7/00 (2017.01); G06V 10/10 (2022.01); G06V 10/82 (2022.01); G06V 30/19 (2022.01); G06V 30/414 (2022.01); G06V 30/418 (2022.01);
U.S. Cl.
CPC ...
G06V 20/95 (2022.01); G06T 7/0002 (2013.01); G06V 10/17 (2022.01); G06V 10/82 (2022.01); G06V 30/19173 (2022.01); G06V 30/414 (2022.01); G06V 30/418 (2022.01); G06T 2207/20021 (2013.01); G06T 2207/30168 (2013.01); G06T 2207/30176 (2013.01); G06V 10/16 (2022.01);
Abstract

Disclosed herein are system, method, and computer program product embodiments for verifying a document. An embodiment operates by receiving an initial image of a document and identifying a first imperfection on a feature of the document. Thereafter, the feature of the initial image is segmented into a first and second partially overlapping segment corresponding to a first and second portion of the feature, respectively. Subsequently, the feature's first portion is determined to be free from the first imperfection, and the first imperfection is identified in the feature's second segment. After receiving a second image of the document including the feature's second portion, the feature's second portion in the second image is determined to be free from a second imperfection. As a result, an image of the feature is created based on the first and second portions of the feature derived from the initial and second images, respectively.


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