The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Mar. 11, 2021
Applicant:

Hitachi Kokusai Electric Inc., Tokyo, JP;

Inventors:

Keigo Hasegawa, Tokyo, JP;

Wataru Ito, Tokyo, JP;

Kazunari Iwanaga, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/52 (2022.01); G06T 7/00 (2017.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06V 20/52 (2022.01); G06T 7/0002 (2013.01); G06T 7/11 (2017.01); G06T 2207/20081 (2013.01); G06V 2201/07 (2022.01);
Abstract

There is provided an image analysis system having an image analysis server which analyzes an input image of a monitoring area and detects a state of a specific monitored object. The image analysis server is configured to divide, in the input image of the monitoring area, a portion of an area in which the monitored object is expected to be present into a plurality of grids, generate a trained model trained by associating '1' with an image of a grid in which the monitored object is present and “0” with an image of a grid in which the monitored object is not present for each grid, calculate, for the input image, a confidence of a presence of the monitored object for each grid using the trained model, determine a presence or absence of the monitored object in the monitoring area based on confidences of the plurality of grids, and detect an abnormality when a confidence value in at least one of the grids is inconsistent with the determination result.


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