The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Jun. 19, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Kenta Akutsu, Tokyo, JP;

Junichi Funada, Tokyo, JP;

Kazuyuki Kon, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G01S 17/89 (2020.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G06T 7/70 (2017.01); G01S 17/89 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Provided is an information processing device capable of determining accuracy of data acquired using an LIDAR sensor. An information processing device () according to the present disclosure includes: an image-capturing sensor (); a learning unit () configured to learn, as learning data, learning image-capturing data and likelihood of a distance between points included in 3D point cloud data with correct answer in a region substantially the same region included in the learning image-capturing data, and to generate a learned model; and an estimation unit () configured to use the learned model to generate estimation data including likelihood of a distance between points included in estimation 3D point cloud data determined based on estimation image-capturing data, from the estimation image-capturing data acquired by the image-capturing sensor ().


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