The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Jul. 29, 2021
Omron Corporation, Kyoto, JP;
Xiangyu Zeng, Kyoto, JP;
OMRON CORPORATION, Kyoto, JP;
Abstract
A method for measuring a dimension of a plant can measure the dimension of a plant efficiently with high accuracy. A method for measuring a dimension of a plant with an image of the plant captured with an imager includes placing, behind the plant, a background plate including a dimensional reference in capturing the image of the plant with the imager, capturing an image of a dimensional measurement point of the plant multiple times with a distance between the dimensional measurement point and the background plate being unchanged and with an imaging distance being changed by moving the imager, and measuring the dimension of the plant based on a value of a dimension at the dimensional measurement point in multiple images resulting from capturing the image multiple times using the dimensional reference in the background plate and on a range of imaging with the imager in each of the images.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile