The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Jul. 25, 2022
Applicant:
Naver Labs Corporation, Seongnam-si, KR;
Inventors:
Min Young Chang, Seongnam-si, KR;
Su Yong Yeon, Seongnam-si, KR;
Soo Hyun Ryu, Seongnam-si, KR;
Dong Hwan Lee, Seongnam-si, KR;
Assignee:
NAVER LABS CORPORATION, Seongnam-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G06T 7/11 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G06T 7/11 (2017.01); G06T 7/73 (2017.01); G06T 2207/20081 (2013.01);
Abstract
A localization method includes scanning a surrounding space by using laser outputted from a reference region; processing spatial information about the surrounding space based on a reflection signal of the laser; extracting feature vectors to which the spatial information has been reflected by using a deep learning network which uses space vectors including the spatial information as input data; and comparing the feature vectors with preset reference map data, and thus estimating location information about the reference region.