The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Oct. 05, 2020
Nec Corporation, Tokyo, JP;
Yuka Oshima, Tokyo, JP;
Takuroh Kashima, Tokyo, JP;
Yusuke Koitabashi, Tokyo, JP;
Atsushi Matsuda, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A first imaging unitgenerates a first image a first image by taking an object to be inspected. A guide display unitdetermines the object to be inspected from the first image by using a model for determining an object to be inspected from an image, and displays an illustration representing the object to be inspected as a guide. A second imaging unitgenerates a second image by superimposing on the guide, and taking the object to be inspected with a recognizable marker regardless of color of an appearance of an object to be inspected, attached in a vicinity of a defect. A defect position determination unitdetermines a position of the defect included in the object to be inspected based on a positional relationship between the illustration and the marker included in the second image. An information collecting unitcollects defect information associated with a type of the object to be inspected and the position of the defect.