The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Mar. 27, 2019
Nec Corporation, Tokyo, JP;
Kyota Higa, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An abnormality detection apparatus () includes an acquisition unit () that acquires input data, an abnormality degree computation unit () that has a discriminative model for computing an abnormality degree of input data, inputs the acquired input data to the discriminative model, and thereby computes an abnormality degree of the input data, a normality degree computation unit () that has a normality model for computing a normality degree of input data, inputs the input data to the normality model, and thereby computes a normality degree of the input data, a determination unit () that has a determination model for performing determination relating to an abnormality level of input data, inputs the abnormality degree and the normality degree to the determination model, and thereby performs determination relating to an abnormality level of the input data, and an output unit () that outputs output information based on a result of the determination.