The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

May. 03, 2022
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

Yuxuan Yan, Shenzhen, CN;

Pei Cheng, Shenzhen, CN;

Gang Yu, Shenzhen, CN;

Bin Fu, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2024.01); G06T 5/20 (2006.01); G06T 5/70 (2024.01); G06T 5/73 (2024.01);
U.S. Cl.
CPC ...
G06T 5/73 (2024.01); G06T 5/20 (2013.01); G06T 5/70 (2024.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

A computing device obtains a to-be-optimized image. The device aligns the to-be-optimized image to obtain a to-be-optimized aligned image. The to-be-optimized aligned image includes a target region having points of objects that are distributed in a standard position. The computing device uses the to-be-optimized aligned image as an inputs to a generation network. The device performs feature extraction on the to-be-optimized aligned image using the generation network, to obtain an optimized image. The generation network is obtained by training a to-be-trained generative adversarial deep neural network model according to a low-quality image pair and a joint loss function. The low-quality image pair includes a target image and a low-quality image corresponding to the target image.


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