The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Mar. 30, 2022
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

Jiahua Fan, Waukesha, WI (US);

Jonathan S. Maltz, Oakland, CA (US);

Norbert Joseph Pelc, Aptos, CA (US);

Assignee:

GE PRECISION HEALTHCARE LLC, Wauwatosa, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2006.01); G06T 11/00 (2006.01); G06V 10/30 (2022.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); A61B 6/03 (2013.01); A61B 6/032 (2013.01); A61B 6/4429 (2013.01); G06T 11/006 (2013.01); G06V 10/30 (2022.01);
Abstract

Methods and systems are provided for contrast-to-noise evaluation in medical imaging systems. In one embodiment, a method includes positioning a phantom having a variable width cross-section within a gantry of a computed tomography (CT) system so that the variable width cross-section is perpendicular to a central axis of the CT system, adjusting the phantom within the gantry of the CT system to a first imaging configuration having a first position and a first translation within the gantry, acquiring a first set of measurements from the phantom in the first imaging configuration, and calculating a contrast-to-noise ratio (CNR) of the CT system based on at least the first set of measurements and a first material density of an imaged slice of the phantom in the first imaging configuration.


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