The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Sep. 09, 2021
Bank of America Corporation, Charlotte, NC (US);
Brandon Sloane, Indian Land, SC (US);
Julio Cesar Nunez, Denver, CO (US);
BANK OF AMERICA CORPORATION, Charlotte, NC (US);
Abstract
A system is provided for electronic data artifact testing using a hybrid centralized-decentralized computing platform. In particular, the system may comprise an artifact testing platform that may be accessed by users and computing devices within a network. Users may upload a data artifact to the artifact testing platform to be validated by the system. The system may then use a number of different validators (e.g., artificial intelligence-based modules) that may read the data artifact and/or the associated metadata and generate a confidence level based on the characteristics of the data artifact. The confidence levels from each validator may be aggregated to generate a final trust score for the data artifact. In this way, the system may provide a secure way to perform validation of data artifacts within a network environment.