The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Oct. 31, 2023
Applicant:

Fortinet, Inc., Sunnyvale, CA (US);

Inventors:

Ernest Mugambi, Dublin, CA (US);

Partha Bhattacharya, Cupertino, CA (US);

Gun Sumlut, Union City, CA (US);

Assignee:

Fortinet, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/04 (2006.01); G06F 21/55 (2013.01);
U.S. Cl.
CPC ...
G06F 21/552 (2013.01); G06F 2221/034 (2013.01);
Abstract

Systems and methods for detecting malicious behavior in a network by analyzing process interaction ratios (PIRs) are provided. According to one embodiment, information regarding historical process activity is maintained. The historical process activity includes information regarding various processes hosted by computing devices of a private network. Information regarding process activity within the private network is received for a current observation period. For each process, for each testing time period of a number of testing time periods within the current observation period, a PIR is determined based on (i) a number of unique computing devices that hosted the process and (ii) a number of unique users that executed the process. A particular process is identified as potentially malicious when a measure of deviation of the PIR of the particular process from a historical PIR mean of the particular process exceeds a pre-defined or configurable threshold during a testing time period.


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