The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Oct. 31, 2023
Applicant:

Intelligent Memory Limited, Kwai Chung, HK;

Inventor:

Mike Hossein Amidi, Lake Forest, CA (US);

Assignee:

Intelligent Memory Limited, Kwai Chung, HK;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/27 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G06F 11/27 (2013.01); G11C 29/56 (2013.01); G11C 29/56004 (2013.01); G11C 29/56012 (2013.01); G11C 29/56016 (2013.01); G11C 2029/5602 (2013.01);
Abstract

A memory testing device uses a master control unit to concurrently operate multiple, intelligent, slave control units (SCUs). SCUs have one or more processing unit(s) (i.e. Finite State Machines, micro controllers, processors) capable of processing one or more firmware with or without operating system (i.e. bare-metal, embedded OS, RTOS (real time operating system)) to perform a series of task defined by firmware(s) for testing volatile and/or non-volatile memory devices connected into one or more DUT devices plus SCU has capability of having operating system and install and run host applications locally within each SCU units to mimic host applications environments along with performing regular memory testing.


Find Patent Forward Citations

Loading…