The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

May. 14, 2021
Applicant:

University of South Florida, Tampa, FL (US);

Inventors:

Mahsa Mozaffari, Rochester, NY (US);

Keval Doshi, Tampa, FL (US);

Yasin Yilmaz, Tampa, FL (US);

Assignee:

University of South Florida, Tampa, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/006 (2013.01); G06N 20/00 (2019.01); G06F 2201/86 (2013.01);
Abstract

A system and method for real-time detection of anomalies in high-dimensional systems. Various embodiments detect anomalies quickly and accurately to allow adequate time for appropriate countermeasures to be implemented. The sequential and multivariate anomaly detection method scales well to high-dimensional datasets using a nonparametric and semi-supervised approach that trains only on nominal data.


Find Patent Forward Citations

Mozaffari, Mahsa. (2024). System and method for online multivariate anomaly detection and localization (U.S. Patent No. 12174689). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12174689

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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