The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Jun. 17, 2020
Kemira Oyj, Helsinki, FI;
Iiris Joensuu, Espoo, FI;
Marjatta Piironen, Espoo, FI;
Kemira Oyj, Helsinki, FI;
Abstract
Estimating or predicting runnability or end product quality risk level for a pulp or papermaking process is disclosed. The method includes measuring hydrophobicity values of samples originating from a same aqueous process stream. A hydrophobicity measurement signal is produced of measured hydrophobicity values as a function of time. A risk level is calculated for the process. At least one mathematical index is calculated based on the hydrophobicity measurement signal, and optionally based on the amount of particles in the sample, other property of the aqueous stream and/or production data. The mathematical index and optionally the amount of the particles, other property, and/or production data is used as a risk indicator input in the calculation. Based on the risk level calculated for the pulp or papermaking process, the runnability and/or end product quality risk level for the pulp or papermaking process is indicated.