The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Aug. 28, 2020
Zhejiang University, Zhejiang, CN;
Zhejiang Lab, Zhejiang, CN;
Xingfan Chen, Zhejiang, CN;
Yishi Liu, Zhejiang, CN;
Xiaowen Gao, Zhejiang, CN;
Nan Li, Zhejiang, CN;
Huizhu Hu, Zhejiang, CN;
Cheng Liu, Zhejiang, CN;
ZHEJIANG UNIVERSITY, Zhejiang, CN;
ZHEJIANG LAB, Zhejiang, CN;
Abstract
An absolute gravimeter and a measurement method based on vacuum optical tweezers. The micro-nano particle releasing device is equipped with micro-nano particles, and is located above laser optical tweezers, and the laser optical tweezers have two capturing beams which pass through the respective convergent lenses and then converge at an intersection. An area where the intersection is located serves as an optical trap capturing region, and the micro-nano particles are stably captured by the two capturing beams in the optical trap capturing region. The optical interferometer is electrically connected to the signal processing device, the optical interferometer measures a displacement of the micro-nano particles in real time at the beginning of a free fall process from the optical trap capturing region and sends the displacement signal to the signal processing device. The signal processing device obtains a measured value of an absolute gravitational acceleration.