The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Mar. 15, 2022
Applicant:

Steradian Semiconductors Private Limited, Bengaluru, IN;

Inventors:

Apu Sivadas, Bengaluru, IN;

Gireesh Rajendran, Bengaluru, IN;

Sai Gunaranjan Pelluri, Bengaluru, IN;

Ankit Sharma, Bengaluru, IN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/35 (2006.01); G01S 13/58 (2006.01);
U.S. Cl.
CPC ...
G01S 7/354 (2013.01); G01S 13/584 (2013.01);
Abstract

According to an aspect, a method of determining Doppler in a radar system comprising receiving a set of chirps, sampling in time the set of chirps to generate a set of non-uniform samples with one sample per chirp that is non-uniform in time in each chirp across the set of chirps, generating a first Doppler frequency from the set of non-uniform samples, generating a set of non-aliased Doppler frequencies for the first Doppler frequencies from a corresponding set of hypothesis, determining a first set of angles of arrival for every non-aliased Doppler frequency in the a set of non-aliased Doppler frequencies and selecting a first non-aliased Doppler frequency in the set of non-aliased Doppler frequencies that corresponds to the first angle of arrival with a minimum error in the a set of angles of arrival.


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