The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Jul. 25, 2022
Aptiv Technologies Ag, Schaffhausen, CH;
Christopher David Gianelli, La Porte, IN (US);
APTIV TECHNOLOGIES AG, Schaffhausen, CH;
Abstract
Empirical data fitting with Ordered Statistic Constant False Alarm Rate (CFAR) detection is described. An empirical approach is used to derive data for indicated expected target responses to provide a CFAR in a variety of different noise distributions. Multiple (e.g., at least two) ordered-statistics are extracted from radar data, which are then used identify a ratio for mapping to an appropriate CFAR multiplier of quantile function for a distribution at hand. Empirical data fitting evaluates an ordered-statistic ration (OSR) against expected OSR values. From evaluating the expected OSR values derived from multiple test frames, a mapping between measured OSR values and their appropriate CFAR multiplier is derived. Through this empirical data fitting, a radar system can perform CFAR detection to account for shape shifts or other variations in a noise distribution beyond just fluctuations in noise strength.