The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
May. 07, 2021
Stichting Radboud Universiteit, Nijmegen, NL;
David Norris, Nijmegen, NL;
Stichting Radboud Universiteit, Nijmegen, NL;
Abstract
The invention provides a method for performing a magnetic resonance measurement of an element in a target region, wherein the element has a magnetic resonance excitation spectrum peak with a linewidth L, wherein the method comprises a measurement cycle () comprising: a magnetization transfer stage () comprising providing a plurality of pulses () of first radiation to the target region, wherein the plurality of pulses () are selected to provide a net pulse having a net pulse angle α≤1°, and wherein the first radiation comprises a first frequency spectrum peak having a first linewidth L, wherein the first frequency spectrum peak at least partially overlaps with the magnetic resonance excitation spectrum peak, and wherein L≥5*L; an excitation stage () comprising providing a radio frequency pulse to the target region, wherein the radio frequency pulse excites the element resulting in a transverse magnetization of the element; and a measurement stage () comprising detecting a signal from the element, wherein the measurement stage () is temporally arranged at an echo time TE after the radio frequency pulse, wherein the echo time TE is smaller than a transverse relaxation time of the element in the target region.