The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Jul. 23, 2024
Applicant:

Beihang University, Beijing, CN;

Inventors:

Jie Tian, Beijing, CN;

Siao Lei, Beijing, CN;

Yu An, Beijing, CN;

Assignee:

Beihang University, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/12 (2006.01);
U.S. Cl.
CPC ...
G01R 33/1276 (2013.01);
Abstract

An MPI device based on parallel scanning of multiple magnetic field free lines (FFLs) is provided. The MPI device includes a first coil, a second coil, an excitation coil, and a receiving coil; the first coil is configured to receive a first-frequency current and generate a plurality of FFLs; the second coil is configured to receive the first-frequency current and drive the FFLs to rotate under a joint action with the first coil; the excitation coil is configured to receive a second-frequency current and drive the FFLs to scan fast; the receiving coil receives a particle signal scanned by the FFLs at each time point; and the first coil, the second coil, the excitation coil and the receiving coil are provided in longitudinal symmetry along the center of the imaging field of view.


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