The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Apr. 27, 2023
Applicant:
Huawei Technologies Co., Ltd., Shenzhen, CN;
Inventors:
Zhe Tao, Shanghai, CN;
Ge Shen, Shenzhen, CN;
Jianlong Cao, Shanghai, CN;
Ming Wang, Shenzhen, CN;
Rui Fang, Shanghai, CN;
Assignee:
HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G06F 9/48 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318544 (2013.01); G06F 9/4881 (2013.01);
Abstract
A fault detection method includes: obtaining a scheduling table of a target task, where the scheduling table is used to indicate at least one test pattern, the at least one test pattern is used to detect a fault in a target logic circuit, and the target logic circuit is a logic circuit configured to execute the target task; and executing the at least one test pattern based on the scheduling table, to detect the fault in the target logic circuit.