The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Sep. 30, 2022
Applicant:
Endress+hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Inventors:
Joseph B. Slater, Dexter, MI (US);
James M. Tedesco, Livonia, MI (US);
Assignee:
Endress+Hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01N 2201/12746 (2013.01);
Abstract
A calibration reference for a multipass Raman analysis system, wherein a combination excitation and collection beam passes through a focal point Fwithin a sample volume multiple times, is provided. The calibration reference includes a body of material having a known spectral response when illuminated by the combination excitation and collection beam. The size or shape of the body is selected or modified to keep the focal point at Fwithin the body when the body is positioned within the sample volume for calibration purposes.