The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Jul. 30, 2019
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Masahiro Miyashita, Tokyo, JP;

Kazushi Sekine, Tokyo, JP;

Sohei Samejima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 1/143 (2021.01); G01K 11/32 (2021.01); G01K 11/3206 (2021.01);
U.S. Cl.
CPC ...
G01K 1/143 (2013.01); G01K 11/32 (2013.01); G01K 11/3206 (2013.01);
Abstract

To provide a temperature measurement system, which is capable of preventing distortion that occurs in a temperature measurement object from being transmitted to an optical fiber, and improving responsiveness of heat transfer from the temperature measurement object to the optical fiber. The temperature measurement system includes: a temperature measurement object; an optical fiber provided on the temperature measurement object; an intermediate material provided on the optical fiber; and a pressing jig which is provided on the temperature measurement object, and is configured to press the optical fiber against the temperature measurement object through intermediation of the intermediate material, wherein the optical fiber is expandable and contractible in a longitudinal direction of the optical fiber due to a change in a temperature of the optical fiber with respect to the temperature measurement object and the intermediate material.


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