The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
May. 05, 2021
X-rite Incorporated, Grand Rapids, MI (US);
Chris Boes, Grandville, MI (US);
Richard Van Andel, Grand Rapids, MI (US);
Rob Kuschinsky, Grand Rapids, MI (US);
David Salyer, Grand Rapids, MI (US);
Brad Remenak, Grand Rapids, MI (US);
Abstract
A multichannel color measurement instrument for measuring spectral properties of a target comprises pick-up optics to collect measurement light, first and second anamorphic optical paths optically coupled to the pick up optics, a pick-up polarizing element located to polarize measurement light in the second anamorphic optical path, a reference anamorphic optical path including a reference illumination source, and a two-dimensional variable filter sensor having an optically transmissive filter function that varies in a first direction parallel to a surface of the variable filter sensor and is substantially constant in a second direction parallel to a surface of the variable filter sensor and orthogonal to the first direction. The anamorphic optical paths spread the measurement light in the first direction direct it on to different portions of the variable filter sensor.