The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Apr. 13, 2022
Applicant:

Align Technology, Inc., San Jose, CA (US);

Inventors:

Leon Rasovsky, Mountain View, CA (US);

Avi Kopelman, Palo Alto, CA (US);

Nir Makmel, Tel Aviv, IL;

Assignee:

Align Technology, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61C 11/00 (2006.01); A61C 7/00 (2006.01); A61C 13/00 (2006.01); A61C 7/08 (2006.01); A61C 9/00 (2006.01);
U.S. Cl.
CPC ...
A61C 13/0004 (2013.01); A61C 7/002 (2013.01); A61C 11/00 (2013.01); A61C 7/08 (2013.01); A61C 9/0046 (2013.01);
Abstract

A dental articulator includes a first arm hingedly joined to a second arm about a pivot axis, where each one of the first arm and the second arm are configured to mount a dental model comprising at least one measurement element, and an inspection tool capable of checking the at least one measurable element against allowable tolerances. Each arm includes a mounting bracket having a distal portion adapted to mount the respective dental model and having a proximal portion. Each arm further has a base member having a distal portion adapted to hingedly join the first arm and the second arm about the pivot axis. The inspection tool comprises a first measurement device and a second measurement device. The first measurement device is coupled to the first arm or second arm and the second measurement device is coupled to the first arm or second arm.


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