The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2024

Filed:

Feb. 18, 2022
Applicant:

Maui Imaging, Inc., San Jose, CA (US);

Inventors:

Artem Belevich, San Jose, CA (US);

Josef R. Call, Campbell, CA (US);

Bruce R. Ritzi, Sunnyvale, CA (US);

Nathan W. Osborn, Palo Alto, CA (US);

Assignee:

Maui Imaging, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 6/58 (2024.01); A61B 8/08 (2006.01); A61B 8/12 (2006.01); G01S 7/52 (2006.01);
U.S. Cl.
CPC ...
A61B 8/587 (2013.01); A61B 6/584 (2013.01); A61B 8/12 (2013.01); A61B 8/4477 (2013.01); A61B 8/4488 (2013.01); A61B 8/4494 (2013.01); A61B 8/483 (2013.01); G01S 7/52052 (2013.01);
Abstract

The quality of ping-based ultrasound imaging is dependent on the accuracy of information describing the precise acoustic position of transmitting and receiving transducer elements. Improving the quality of transducer element position data can substantially improve the quality of ping-based ultrasound images, particularly those obtained using a multiple aperture ultrasound imaging probe, i.e., a probe with a total aperture greater than any anticipated maximum coherent aperture width. Various systems and methods for calibrating element position data for a probe are described.


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