The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2024
Filed:
Jan. 11, 2023
Nanchang Hangkong University, Nanchang, CN;
Xingdao He, Nanchang, CN;
Jiulin Shi, Nanchang, CN;
Yubao Zhang, Nanchang, CN;
Zhongqi Hao, Nanchang, CN;
Gang Shi, Nanchang, CN;
Jin Xu, Nanchang, CN;
Nanchang Hangkong University, Nanchang, CN;
Abstract
Disclosed is a Brillouin-optical coherence-speckle based multi-mode elasticity measurement device, including a Brillouin-optical coherence elastography common-path scanning unit, a Brillouin scattering elastography system, an optical coherence elastography system, a speckle elastography system, and a time sequence controller, where the Brillouin scattering elastography system and the optical coherence elastography system share the Brillouin-optical coherence elastography common-path scanning unit. According to the present invention, advantages that Brillouin scattering elastography can perform high-precision measurement on a bulk elasticity modulus, optical coherence elastography can rapidly obtain an elasticity distribution of an entire sample to perform three-dimensional elasticity mapping, and laser speckle elastography can perform wide-field elasticity measurement are utilized to perform in-situ synchronous imaging on elasticity distribution of lesion tissue, so that scientific basis and technical support are provided for early diagnosis of clinical diseases.