The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2024

Filed:

Sep. 18, 2023
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Hrushikesh Tukaram Garud, Maharashtra, IN;

Mihir Narendra Mody, Bangalore, IN;

Soyeb Nagori, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/86 (2014.01); H04N 19/117 (2014.01); H04N 19/147 (2014.01); H04N 19/149 (2014.01); H04N 19/176 (2014.01); H04N 19/182 (2014.01); H04N 19/82 (2014.01);
U.S. Cl.
CPC ...
H04N 19/147 (2014.11); H04N 19/117 (2014.11); H04N 19/149 (2014.11); H04N 19/176 (2014.11); H04N 19/182 (2014.11); H04N 19/82 (2014.11);
Abstract

The disclosure provides a sample adaptive offset (SAO) encoder. The SAO encoder includes a statistics collection (SC) block and a rate distortion optimization (RDO) block coupled to the SC block. The SC block receives a set of deblocked pixels and a set of original pixels. The SC block categorizes each deblocked pixel of the set of deblocked pixels in at least one of a plurality of band and edge categories. The SC block estimates an error in each category as difference between a deblocked pixel of the set of deblocked pixels and corresponding original pixel of the set of original pixels. The RDO block determines a set of candidate offsets associated with each category and selects a candidate offset with a minimum RD cost. The minimum RD cost is used by a SAO type block and a decision block to generate final offsets for the SAO encoder.


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