The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2024
Filed:
Oct. 04, 2019
Nokia Technologies Oy, Espoo, FI;
Federico Penna, San Diego, CA (US);
Daejung Yoon, Massy, FR;
NOKIA TECHNOLOGIES OY, Espoo, FI;
Abstract
A system comprising a first apparatus, a second apparatus and a third apparatus, wherein the first apparatus is configured to provide, to a second apparatus, information regarding a number of antennas and/or an oversampling factor; the second apparatus is configured to transmit a plurality of beams in accordance with the information received from the first apparatus regarding the number of antennas and the oversampling factor; the third apparatus configured to receive a plurality of beamformed reference signals transmitted by the second apparatus, obtain measurement results for at least two of the plurality of beamformed reference signals, wherein the measurement results comprise one or more of: reference signal received power value, beam identifier, a value indicating uncertainty of the accuracy of the reference signal received power value; and transmit the measurement results to the second apparatus; and wherein the second apparatus is further configured to: process the received measurement results to obtain information regarding a position of the third apparatus and to transmit the obtained information regarding the position of the third apparatus to the first apparatus; and wherein the first apparatus is further configured to receive further measurement results from at least one further apparatus in addition to the second apparatus and to determine the location of the third apparatus based on the received measurement results and the received further measurement results.