The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2024
Filed:
May. 19, 2022
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A method of optimizing the detection of abnormalities in images of products generates a first image similar to training images and a second image similar to testing images with normal images and the images showing abnormalities inputted into a generative adversarial network (GAN). The GAN determines a first similarity ratio between the first image and the training image and generates a parameter based on the first similarity ratio for adjusting the GAN. A second similarity ratio between the second image and the testing image is determined. The testing image is deemed a normal image when the second similarity ratio is larger than the specified threshold value, and deemed to be an image revealing abnormalities when the second similarity ratio is less than or equal to the specified threshold value. A terminal device and a computer readable storage medium applying the method are also provided.