The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2024
Filed:
Jan. 28, 2022
Nec Corporation, Tokyo, JP;
Tomokazu Kaneko, Tokyo, JP;
Katsuhiko Takahashi, Tokyo, JP;
Makoto Terao, Tokyo, JP;
Soma Shiraishi, Tokyo, JP;
Takami Sato, Tokyo, JP;
Yu Nabeto, Tokyo, JP;
Ryosuke Sakai, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An image acquisition unitacquires a plurality of images. The plurality of images include an object to be inferred. An image cut-out unitcuts out an object region including the object from each of the plurality of images acquired by the image acquisition unit. An importance generation unitgenerates importance information by processing the object region cut out by the image cut-out unit. The importance information indicates the importance of the object region when an object inference model is generated, and is generated for each object region, that is, for each image acquired by the image acquisition unit. A learning data generation unitstores a plurality of object regions cut out by the image cut-out unitand a plurality of pieces of importance information generated by the importance generation unitin a learning data storage unitas at least a part of the learning data.