The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2024

Filed:

Jan. 23, 2023
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Yonatan Hyatt, Tel-Aviv, IL;

Joel Koenka, Feherto, HU;

Harel Boren, Givat Shmuel, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01);
Abstract

An automatic inspection process for detecting visible defects on a manufactured item, the process including a set up mode in which images of same-type defect free items, but not images of same-type defected items, are obtained, and an inspection mode in which images of both same-type defect free items and same-type defected items, are obtained and defects are detected, where images of the same-type defect free items are analyzed and based on the analysis the process switches to the inspection mode.


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