The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2024
Filed:
Jan. 19, 2022
Toyota Jidosha Kabushiki Kaisha, Toyota, JP;
Tomohiro Matsuda, Toyota, JP;
TOYOTA JIDOSHA KABUSHIKI KAISHA, Toyota, JP;
Abstract
A method of detecting an abnormality includes: acquiring an image of an inspection target as a captured image; generating a restored image by inputting the captured image into a first learning model, wherein the first learning model has learned with a normal image, wherein the normal image obtained by capturing a normal inspection target; generating a difference image between the captured image and the restored image; generating a restored difference image by inputting the generated difference image into a second learning model, wherein the second learning model has learned with a normal difference image; and detecting abnormality of the inspection target using the difference image and the restored difference image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile