The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2024
Filed:
Jan. 05, 2022
Honeywell Federal Manufacturing & Technologies, Llc, Kansas City, MO (US);
Eric Michael Brannigan, Lenexa, KS (US);
Benjamin Ross Brown, Lee's Summit, MO (US);
Honeywell Federal Manufacturing & Technologies, LLC, Kansas City, MO (US);
Abstract
A method of detecting a deformation in a lattice structure comprises capturing first image data of the lattice structure via a first image capturing device with a first telecentric lens and a second image capturing device with a second telecentric lens. The first telecentric lens is directed toward the lattice structure, and the second telecentric lens is spaced apart from the first telecentric lens and also directed toward the lattice structure. The method includes compressing the lattice structure; capturing second image data of the lattice structure via the first and second image capturing devices; and detecting the deformation based at least in part on the first and second image data.