The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2024

Filed:

Apr. 10, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Takahiro Kakumaru, Tokyo, JP;

Naoki Sasamura, Tokyo, JP;

Takaaki Ohara, Tokyo, JP;

Yuya Yamada, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/55 (2013.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 21/554 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G06F 2221/034 (2013.01);
Abstract

The rule learning unitperforms rough sets analysis using training data that includes threat information including a plurality of explanatory variables representing a threat event and a discrimination result of discriminating the threat information, to learn a decision rule specifying the discrimination result depending on a combination of the explanatory variables. The input unitinputs the threat information to be analyzed. The analysis unitapplies the input threat information to the decision rule to identify the discrimination result of the threat information, and the explanatory variable as a basis for the discrimination result.


Find Patent Forward Citations

Loading…