The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2024

Filed:

Sep. 22, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Kazumi Kimura, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/12 (2006.01); G03G 15/043 (2006.01);
U.S. Cl.
CPC ...
G03G 15/043 (2013.01); G02B 26/125 (2013.01);
Abstract

An apparatus includes a deflecting unit deflecting a light flux from a light source to scan a scanned surface in a main scanning direction, and an imaging optical system guiding the deflected light flux the scanned surface. A width of the light flux is larger than that of a deflecting surface of the deflecting unit in a main scanning cross section when it is incident on deflecting surface. A refractive power in main scanning cross section of the imaging optical system is different between a first position through which an on-axis light flux passes and a second position through which an outermost off-axis light flux passes. A first region at one side is longer than a second region at the other side with respect to an optical axis of the imaging optical system on the scanned surface.


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