The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2024
Filed:
Mar. 23, 2021
Applicant:
Point Engineering Co., Ltd., Chungcheongnam-do, KR;
Inventors:
Bum Mo Ahn, Gyeonggi-do, KR;
Sung Hyun Byun, Gyeonggi-do, KR;
Dong Hyeok Seo, Chungcheongnam-do, KR;
Assignee:
POINT ENGINEERING CO., LTD., Chungcheongnam-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07378 (2013.01); G01R 1/07342 (2013.01); G01R 31/2886 (2013.01);
Abstract
Proposed are a probe head for testing, through a probe, a pattern formed on a wafer, and a probe card having the same. More particularly, proposed are a probe head in which formation of a guide hole into which a probe is inserted and insertion of the probe therein are facilitated, and a probe card having the same.
Ahn, Bum. (2024). Probe head and probe card comprising same (U.S. Patent No. 12169212). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12169212
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile