The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2024

Filed:

Mar. 04, 2022
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Kyoto University, Kyoto, JP;

Inventors:

Hidefumi Takamine, Shinagawa, JP;

Yuki Ueda, Kawasaki, JP;

Kazuo Watabe, Yokohama, JP;

Tomoki Shiotani, Kyoto, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/44 (2006.01); G01N 29/04 (2006.01); G01N 29/34 (2006.01);
U.S. Cl.
CPC ...
G01N 29/4445 (2013.01); G01N 29/043 (2013.01); G01N 29/045 (2013.01); G01N 29/341 (2013.01);
Abstract

According to one embodiment, a structure evaluation system according to an embodiment includes a plurality of sensors, a position locator, a corrector, and an evaluator. The plurality of sensors detect elastic waves generated from a structure. The position locator locates the position of a generation sources of a plurality of elastic waves on the basis of the plurality of elastic waves detected by the plurality of sensors. The corrector corrects information based on the position locating performed by the position locator using a correction value set in correspondence with an impact. The evaluator evaluates a deterioration state of the structure on the basis of the corrected information.


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