The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2024

Filed:

Apr. 01, 2021
Applicant:

Smart Laser & Plasma Systems Co., Tokushima, JP;

Inventors:

Yoshihiro Deguchi, Tokushima, JP;

Takahiro Kamimoto, Tokushima, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/39 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/39 (2013.01); G01N 33/0027 (2013.01); G01N 2201/06113 (2013.01);
Abstract

This gas analysis device comprises: a laser light source which irradiates a gas to be measured with laser light; a laser control means which controls the laser light source so that the wavelength of the laser light is changed in each prescribed wavelength band; a light detection means which photoelectrically converts the laser light that have passed through the gas to be measured and outputs an electrical signal; and an interpretation means which analyzes, on the basis of the electrical signal, an absorption wavelength of the gas to be measured. In the gas analysis device, the laser control means controls the laser light source so that the intensity of the laser light changes into a shape (for example, a rectangular shape or a trapezoidal shape) having at least a substantially constant flat part in a prescribed time period, and the wavelength of the laser light changes in the time period.


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