The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2024
Filed:
Mar. 29, 2021
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventors:
Kunihiko Sasaki, Tochigi, JP;
Yasuhiro Hatakeyama, Tochigi, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G01M 11/02 (2006.01); H04N 23/63 (2023.01);
U.S. Cl.
CPC ...
G01M 11/0257 (2013.01); H04N 23/63 (2023.01);
Abstract
An optical apparatus evaluating method includes the steps of acquiring first data on a performance of an optical apparatus, which changes along with use of the optical apparatus, acquiring second data on a reference performance of the optical apparatus, and evaluating the performance of the optical apparatus using the first data and the second data.
Sasaki, Kunihiko. (2024). Optical apparatus evaluating method (U.S. Patent No. 12169154). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12169154
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile