The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2024
Filed:
Mar. 27, 2023
Faro Technologies, Inc., Lake Mary, FL (US);
Daniel Döring, Ditzingen, DE;
Rasmus Debitsch, Fellbach, DE;
Rene Pfeiffer, Muehlacker, DE;
Axel Ruhland, Stuttgart, DE;
FARO Technologies, Inc., Lake Mary, FL (US);
Abstract
A system and method for providing feedback on a quality of a 3D scan is provided. The system includes a coordinate scanner configured to optically measure and determine a plurality of three-dimensional coordinates to a plurality of locations on at least one surface in the environment, the coordinate scanner being configured to move through the environment while acquiring the plurality of three-dimensional coordinates. A display having a graphical user interface. One or more processors are provided that are configured to determine a quality attribute of a process of measuring the plurality of three-dimensional coordinates based at least in part on the movement of the coordinate scanner in the environment and display a graphical quality indicator on the graphical user interface based at least in part on the quality attribute, the quality indicator is a graphical element having at least one movable element.